Students must pass all subjects of the study plan. Master's thesis defence requires approval of all previous subjects. It requires the following skills: Statistics Applied to Metrology; Metrology (temperature, humidity, pressure and geometric dimension sensors, electrical transducers); Advanced Calculus of Uncertainty in Calibration and Testing (GUM and Monte Carlo); Metrological Laboratory Accreditation (NP EN ISO/IEC 17 025); Confirmation Metrology (NP EN ISO 10012); Management of Industrial Measurement Systems; Tools Open Source in Business and Metrological environment; Image processing (industrial measurement); Pattern Recognition and Classifier (Image); Physical Principles of MRI and CT scan; Handling (sensors, actuators, programming) of industrial robots; Using MATLAB/Simulink for the analysis of digital control systems; Handling Programmable Logic Controllers; Nanostructures, Micro/Nanofabrication; Instrumentation and Metrology in nano materials characterization (nanomechanics, nanotribology, nanoelectronics, nanobiotechnology); Techniques for Nondestructive testing. The Optional subjects require the student to acquire the following skills: - Models based on Linear Programming, Network Optimization models and models of sequential decisions; - Implementing Quality Management Systems-SGQ (NP EN ISO 9001:2000); - Advanced Tools Engineering Quality including QFD, FMEA, Taguchi Loss Function, Planning Experiments, 8D); - Management Quality Systems in Health (ISO 9001, HQS, JCA, EFQM); - Techniques for Statistical Control of a Process; - Reliability;
| 1º Ano | ||
|---|---|---|
| Unidade curricular | Período | ECTS |
| Industrial Automation and Control | 1st Semester | |
| Computational Tools for Instrumentation and Metrology | 1st Semester | |
| Applied instrumentation | 1st Semester | |
| Industrial Robotics | 1st Semester | |
| Project Management (optional) | 1st Semester | |
| Business Administration (optional) | 1st Semester | |
| Quality Tools (optional) | 1st Semester | |
| Materials Characterization and Metrology | 2st Semester | |
| Instrumentation and Metrology in Nanotechnology | 2st Semester | |
| Applied metrology | 2st Semester | |
| Instrumentation Seminar | 2st Semester | |
| Experimental Statistics and Data Analysis (optional) | 2st Semester | |
| Reliability and Maintenance (optional) | 2st Semester | |
| Operations Research (optional) | 2st Semester | |
| 2º Ano | ||
| Unidade curricular | Período | ECTS |
| Image Metrology | 1st Semester | |
| Metrology Seminar | 1st Semester | |
| CT and MRI Systems | 1st Semester | |
| Thesis / Project / Internship | Annual | |


