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MASTER IN INSTRUMENTATION ENGINEERING AND METROLOGY

Students must pass all subjects of the study plan. Master's thesis defence requires approval of all previous subjects. It requires the following skills: Statistics Applied to Metrology; Metrology (temperature, humidity, pressure and geometric dimension sensors, electrical transducers); Advanced Calculus of Uncertainty in Calibration and Testing (GUM and Monte Carlo); Metrological Laboratory Accreditation (NP EN ISO/IEC 17 025); Confirmation Metrology (NP EN ISO 10012); Management of Industrial Measurement Systems; Tools Open Source in Business and Metrological environment; Image processing (industrial measurement); Pattern Recognition and Classifier (Image); Physical Principles of MRI and CT scan; Handling (sensors, actuators, programming) of industrial robots; Using MATLAB/Simulink for the analysis of digital control systems; Handling Programmable Logic Controllers; Nanostructures, Micro/Nanofabrication; Instrumentation and Metrology in nano materials characterization (nanomechanics, nanotribology, nanoelectronics, nanobiotechnology); Techniques for Nondestructive testing. The Optional subjects require the student to acquire the following skills: - Models based on Linear Programming, Network Optimization models and models of sequential decisions; - Implementing Quality Management Systems-SGQ (NP EN ISO 9001:2000); - Advanced Tools Engineering Quality including QFD, FMEA, Taguchi Loss Function, Planning Experiments, 8D); - Management Quality Systems in Health (ISO 9001, HQS, JCA, EFQM); - Techniques for Statistical Control of a Process; - Reliability;

 

diurno
Número: M580
Data:
01/01/2001
N.º Despacho/Portaria: 9220/2012
Data:
09/07/2012
1º Ano
Unidade curricular Período ECTS
Industrial Automation and Control 1st Semester
Computational Tools for Instrumentation and Metrology 1st Semester
Applied instrumentation 1st Semester
Industrial Robotics 1st Semester
Project Management (optional) 1st Semester
Business Administration (optional) 1st Semester
Quality Tools (optional) 1st Semester
Materials Characterization and Metrology 2st Semester
Instrumentation and Metrology in Nanotechnology 2st Semester
Applied metrology 2st Semester
Instrumentation Seminar 2st Semester
Experimental Statistics and Data Analysis (optional) 2st Semester
Reliability and Maintenance (optional) 2st Semester
Operations Research (optional) 2st Semester
2º Ano
Unidade curricular Período ECTS
Image Metrology 1st Semester
Metrology Seminar 1st Semester
CT and MRI Systems 1st Semester
Thesis / Project / Internship Annual