Students must pass all subjects of the study plan. Master's thesis defence requires approval of all previous subjects. It requires the following skills: Statistics Applied to Metrology; Metrology (temperature, humidity, pressure and geometric dimension sensors, electrical transducers); Advanced Calculus of Uncertainty in Calibration and Testing (GUM and Monte Carlo); Metrological Laboratory Accreditation (NP EN ISO/IEC 17 025); Confirmation Metrology (NP EN ISO 10012); Management of Industrial Measurement Systems; Tools Open Source in Business and Metrological environment; Image processing (industrial measurement); Pattern Recognition and Classifier (Image); Physical Principles of MRI and CT scan; Handling (sensors, actuators, programming) of industrial robots; Using MATLAB/Simulink for the analysis of digital control systems; Handling Programmable Logic Controllers; Nanostructures, Micro/Nanofabrication; Instrumentation and Metrology in nano materials characterization (nanomechanics, nanotribology, nanoelectronics, nanobiotechnology); Techniques for Nondestructive testing. The Optional subjects require the student to acquire the following skills: - Models based on Linear Programming, Network Optimization models and models of sequential decisions; - Implementing Quality Management Systems-SGQ (NP EN ISO 9001:2000); - Advanced Tools Engineering Quality including QFD, FMEA, Taguchi Loss Function, Planning Experiments, 8D); - Management Quality Systems in Health (ISO 9001, HQS, JCA, EFQM); - Techniques for Statistical Control of a Process; - Reliability;
1º Ano | ||
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Unidade curricular | Período | ECTS |
Industrial Automation and Control | 1st Semester | |
Computational Tools for Instrumentation and Metrology | 1st Semester | |
Applied instrumentation | 1st Semester | |
Industrial Robotics | 1st Semester | |
Project Management (optional) | 1st Semester | |
Business Administration (optional) | 1st Semester | |
Quality Tools (optional) | 1st Semester | |
Materials Characterization and Metrology | 2st Semester | |
Instrumentation and Metrology in Nanotechnology | 2st Semester | |
Applied metrology | 2st Semester | |
Instrumentation Seminar | 2st Semester | |
Experimental Statistics and Data Analysis (optional) | 2st Semester | |
Reliability and Maintenance (optional) | 2st Semester | |
Operations Research (optional) | 2st Semester | |
2º Ano | ||
Unidade curricular | Período | ECTS |
Image Metrology | 1st Semester | |
Metrology Seminar | 1st Semester | |
CT and MRI Systems | 1st Semester | |
Thesis / Project / Internship | Annual |